Recently the pc shuts down by itself there is no BSOD
There's definitely a lot of bug checks hapenning here, so there is a BSOD. You just may not be seeing it.
3: kd> .bugcheck
Bugcheck code 00000124
Arguments 00000000`00000000 fffffa80`0aa7a8f8 00000000`00000000 00000000`00000000
If we dump the WER structure:
Section 2 : x86/x64 MCA
Descriptor @ fffffa800aa7aa08
Section @ fffffa800aa7ab90
Offset : 664
Length : 264
Flags : 0x00000000
Severity : Fatal
Error : BUSLG_GENERIC_ERR_*_TIMEOUT_ERR (Proc 0 Bank 4)
Status : 0xfa00000000070f0f
It's a generic timeout error on the bus, and given the symptoms you described, I'd say this is bad RAM.
Run memtest for 8 passes:
Download Memtest86+ here:
Which should I download?
You can either download the pre-compiled .ISO that you would burn to a CD and then boot from the CD, or you can download the auto-installer for the USB key. What this will do is format your USB drive, make it a bootable device, and then install the necessary files. Both do the same job, it's just up to you which you choose, or which you have available (whether it's CD or USB).
Do note that some older generation motherboards do not support USB-based booting, therefore your only option is CD (or Floppy if you really wanted to).
How Memtest works (you don't need to read, it's only for those interested in the specifics):
Memtest uses algorithms (specifically two), namely moving inversion & what is deemed Modulo-X. Essentially, the first algorithm fills the memory with a pattern. Starting at the low address, it checks to see if the pattern was changed (it should not have been), writes the patterns complement, increments the address, and repeats. Starting at the highest address (as opposed to the lowest), it follows the same checklist.
The reason for the second algorithm is due to a few limitations, with the first being that not all adjacent cells are being tested for interaction due to modern chips being 4 to 16 bits wide regarding data storage. With that said, patterns are used to go ahead and ensure that all adjacent cells have at least been written with all possible one and zero combinations.
The second is that caching, buffering and out of order execution will interfere with the moving inversions algorithm. However, the second algorithm used is not affected by this. For starting offsets of 0-20, the algorithm will write every 20th location with a pattern, write all other locations with the patterns complement, repeat the previous one (or more) times, and then check every 20th location for the previously mentioned pattern.
Now that you know how Memtest actually works, it's important to know that the tests it goes through all mean something different. It goes from Test 0 through Test 12, many of which use either one or the other algorithm discussed above, among many other things.
Any other questions, they can most likely be answered by reading this great guide here: